被检测半导体器件的详细视图
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被检测半导体器件的详细视图
被检测半导体器件的详细视图这是关于半导体器件在检测中的详细视图，涉及芯片、晶圆、裸片、封装、基板、键合、填充、缺陷、图像、载体、轮廓等，包括塑料、陶瓷、刚性等不同类型，涵盖电路、控制、模块等结构，对其表面贴装、孔洞、焊点等进行检查、测试、记录、对比和审查。
- 素材ID：834884611举报
- 格式：JPG
- 作者：Starkreal
- 尺寸：S1000 x 429px · 35 x 15cm · 72dpiM2300 x 987px · 81 x 34cm · 72dpiL4000 x 1716px · 33 x 14cm · 300dpiF6720 x 2880px · 56 x 24cm · 300dpi
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